Presentation
5 March 2021 Guidelines and pitfalls in characterization of transverse mode instabilities
Author Affiliations +
Abstract
The analysis of TMI has advanced over the last decade, with added observation parameters depending on the complexity of the experimental system. Increasing levels of information have been extracted, from camera images in the beginning over modal decomposition, time trace and frequency analysis, on towards bi directional measurements at multiple system positions and separation of spectral components. We will give an overview of the evolution of TMI analysis for different model systems and discuss the applicability and the additional insight that can be gained from advanced observation methods.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Till Walbaum, Friedrich Möller, Victor Distler, Maximilian Strecker, and Thomas Schreiber "Guidelines and pitfalls in characterization of transverse mode instabilities", Proc. SPIE 11665, Fiber Lasers XVIII: Technology and Systems, 1166511 (5 March 2021); https://doi.org/10.1117/12.2578162
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KEYWORDS
Systems modeling

Bismuth

Cameras

Imaging systems

Oscillators

Raman spectroscopy

Temperature metrology

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