Paper
5 November 2020 Research on focal length measurement of telephoto lens based on Polaris observation
Author Affiliations +
Proceedings Volume 11570, AOPC 2020: Telescopes, Space Optics, and Instrumentation; 115700K (2020) https://doi.org/10.1117/12.2579825
Event: Applied Optics and Photonics China (AOPC 2020), 2020, Beijing, China
Abstract
This paper proposes a improved method for measuring the focal length of a telephoto lens. In this paper, a photoelectric theodolite with high accuracy of angle measurement is used. Besides, a CMOS camera is used to take a position image of the center point of the theodolite, and the corresponding azimuth displayed by the theodolite is recorded. Leveling the optoelectronic theodolite on the open field, Polaris is used as a point light source outdoors. Adjusting the point target on the CMOS image, by which the target is placed in the view center of the field (crosshair center). And then, the pitch and azimuth data of the device are recorded. Adding disturbance to the photoelectric theodolite, the CMOS images is recorded. Adapting methods of target feature segmentation, sub-pixel positioning is performed on the point target image which captured by the CMOS camera. And the point target coordinates is obtained. Finally, the result based on the theodolite angle offset, sub-pixel offset and elevation angle data is calculated. The perturbation data is averaged to calculate the focal length of the telephoto lens. Compared with equipment testing result of focal length, experiments have achieved high measurement accuracy. And this method is suitable for detecting the focal length of an optoelectronic device in an outdoor environment.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xin Zhou, DeChao Liu, ZhiXiang Zhang, Rui Cao, XuYang Li, and XiangLong Gu "Research on focal length measurement of telephoto lens based on Polaris observation", Proc. SPIE 11570, AOPC 2020: Telescopes, Space Optics, and Instrumentation, 115700K (5 November 2020); https://doi.org/10.1117/12.2579825
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KEYWORDS
Collimators

Cameras

CMOS cameras

Computer programming

Imaging systems

Moire patterns

Optical testing

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