A new laser scattering measurement system

Yuxiang Jiang; Zhenhua Li

doi:10.1117/12.2575116

10 October 2020 A new laser scattering measurement system

Yuxiang Jiang, Zhenhua Li

Proceedings Volume 11554, Advanced Sensor Systems and Applications X; 115541J (2020) https://doi.org/10.1117/12.2575116
Event: SPIE/COS Photonics Asia, 2020, Online Only

Abstract

The laser has good coherence and its polarization is easy to modulate. It is an important light source. The surfaces of common objects can be regarded as random rough surfaces at the laser wavelength scale. Random rough surface modulates incident polarized light, and the scattered light contains the information of geometric profile and physical properties of the target surface. For the laser detection system, it is important to perceive the high dimensional information which was contained in the target echo signal. In this paper, the Stokes vector was used to describe the scattered light. The virtual instrument technology was adopted to develop a laser scattering measurement system. The Labview software that running on the computer issued control commands to microcontroller unit (MCU) by serial port communication. We made a high precision digital light detector. The MCU obtained the scattered light intensity from the photoelectric sensor via I²C bus. The incident light was modulated to two typical linearly polarized light using a polaroid and a half wave plate. The Stokes vector could describe the state of the scattered light completely, and which was measured by the polarization detection system. The Stokes vector of all angular hemispheric space backscattering light was measured. The results showed that the scattered light on the surface of metal object appeared circularly polarized component. However, the circular polarized component of the scattered light on the dielectric target surface was almost zero. The above conclusions could provide theoretical basis for the laser detection system to identify metal targets.

Citation Download Citation

Yuxiang Jiang and Zhenhua Li "A new laser scattering measurement system", Proc. SPIE 11554, Advanced Sensor Systems and Applications X, 115541J (10 October 2020); https://doi.org/10.1117/12.2575116

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