Paper
9 April 2020 Acceleration measurement by spectrum of interference signal of self-mixing laser
Author Affiliations +
Proceedings Volume 11458, Saratov Fall Meeting 2019: Laser Physics, Photonic Technologies, and Molecular Modeling; 114580D (2020) https://doi.org/10.1117/12.2559037
Event: Saratov Fall Meeting 2019: VII International Symposium on Optics and Biophotonics, 2019, Saratov, Russian Federation
Abstract
A method for measuring acceleration based on the use of the fast-discrete Fourier transform algorithm is proposed. The simulation of the spectrum of the self-mixing signal at the uniformly accelerated motion of the reflector is carried out. The relationship of low-frequency and high-frequency components of the self-mixing signal spectrum with the object acceleration value is shown. The measurement of uniformly accelerated motion of an object on the spectrum of a self-mixing signal is experimentally realized. The accelerated motion of the reflector was carried out using a signal generator built into the laboratory station of the Ni ELVIS virtual instruments. The results of measuring the motion of piezoceramics with the acceleration given by the quadratic law of voltage change on it are presented. The results of calculation of acceleration on the spectrum of the self-mixing signal for 26 μm/s2 are presented. The resolution of the proposed method was estimated by measuring the frequencies of neighboring spectral components and amounted to 500 nm/s2.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
An. V. Skripal, S. Yu. Dobdin, A. V. Dzhafarov, and K. A. Sadchikova "Acceleration measurement by spectrum of interference signal of self-mixing laser", Proc. SPIE 11458, Saratov Fall Meeting 2019: Laser Physics, Photonic Technologies, and Molecular Modeling, 114580D (9 April 2020); https://doi.org/10.1117/12.2559037
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Reflectors

Semiconductor lasers

Signal processing

Calibration

Computer simulations

Laser interferometry

Microelectromechanical systems

Back to Top