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13 December 2020 Characterization of the reflectivity of various black and white materials
Luke M. Schmidt, Lauren N. Aldoroty, Yasin Alam, Leonardo Bush, D. L. DePoy, Matthew Holden, Doyeon Kim, J. L. Marshall, Mason Perkey
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Proceedings Volume 11451, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV; 114512S (2020) https://doi.org/10.1117/12.2562759
Event: SPIE Astronomical Telescopes + Instrumentation, 2020, Online Only
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Abstract
We report on an expanded catalog of total reflectance measurements of various common (and uncommon) materials used in the construction and/or baffling of optical systems. Total reflectance is measured over a broad wavelength range (250 nm < λ <2500 nm) that is applicable to ultraviolet, visible, and near-infrared instrumentation.
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Luke M. Schmidt, Lauren N. Aldoroty, Yasin Alam, Leonardo Bush, D. L. DePoy, Matthew Holden, Doyeon Kim, J. L. Marshall, and Mason Perkey "Characterization of the reflectivity of various black and white materials", Proc. SPIE 11451, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, 114512S (13 December 2020); https://doi.org/10.1117/12.2562759
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KEYWORDS
Reflectivity
Calibration
Helium neon lasers
Photodiodes
Ultraviolet radiation
Visible radiation
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