Qualification and performance of the Low-Energy X-ray Reflectometer (LEXR)

P. L. Henriksen; F. E. Christensen; S. Massahi; D. D. M. Ferreira; S. Svendsen; N. Gellert; L. M. Vu; A. S. Jegers; B. Shortt

doi:10.1117/12.2562242

13 December 2020 Qualification and performance of the Low-Energy X-ray Reflectometer (LEXR)

P. L. Henriksen, F. E. Christensen, S. Massahi, D. D. M. Ferreira, S. Svendsen, N. Gellert, L. M. Vu, A. S. Jegers, B. Shortt

Author Affiliations +

Proceedings Volume 11444, Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray; 114444J (2020) https://doi.org/10.1117/12.2562242
Event: SPIE Astronomical Telescopes + Instrumentation, 2020, Online Only

Conference Poster

Abstract

A state-of-the-art Low-Energy X-ray Reflectometer (LEXR) is in operation at DTU Space with the main purpose of characterizing coatings for the Advanced Telescope for High-ENergy Astrophysics (ATHENA), a selected Lclass ESA mission. In particular, soft materials are difficult to characterize at higher energies so the 1.487 keV beamline compliments our existing 8.048 keV reflectometer, allowing for a more complete understanding of thinfilm X-ray characteristics. Documenting and qualifying the as-deposited coatings for X-ray telescope optics is of crucial importance, both to ensure that the effective area requirements are met, but also to quantify any temporal evolution in coating characteristics as well as the impact of manufacturing process parameters on mirror performance. It is notably relevant in the case of ATHENA, as there is a desire to enhance the low-energy performance by using a low-Z material overcoating on top of the Ir coating. We report on the commissioning and qualify the performance of the as-built 1.487 keV reflectometer as well as discuss measurement repeatability and system limitations.

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P. L. Henriksen, F. E. Christensen, S. Massahi, D. D. M. Ferreira, S. Svendsen, N. Gellert, L. M. Vu, A. S. Jegers, and B. Shortt "Qualification and performance of the Low-Energy X-ray Reflectometer (LEXR)", Proc. SPIE 11444, Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, 114444J (13 December 2020); https://doi.org/10.1117/12.2562242

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