Three-dimensional measurement method for thickness of LED tape coating based on linear array spectral confocal

Hanyu Hong; Jiaowei Shi; Xiuhua Zhang; Qingsong Zhao

doi:10.1117/12.2538022

14 February 2020 Three-dimensional measurement method for thickness of LED tape coating based on linear array spectral confocal

Hanyu Hong, Jiaowei Shi, Xiuhua Zhang, Qingsong Zhao

Author Affiliations +

Proceedings Volume 11432, MIPPR 2019: Remote Sensing Image Processing, Geographic Information Systems, and Other Applications; 114320Z (2020) https://doi.org/10.1117/12.2538022
Event: Eleventh International Symposium on Multispectral Image Processing and Pattern Recognition (MIPPR2019), 2019, Wuhan, China

Abstract

Traditional measuring equipments and methods cannot satisfy the requirements of micrometer-level accuracy and realtime measurement of LED tape coating, the paper proposes a three-dimensional measurement method to compute the thickness of LED tape coating based on linear array spectral confocal. Firstly, the distance data is collected by linear array spectral confocal scanning and converted into 3D point cloud data, then the point cloud is materialized and smoothed to make the 3D object more realistic. Finally, the 3D entity is interacted in the Point Cloud Library to perform manual measurement of the tiny parts of the object. The subsequent automatic measurements are used to control the grating ruler for the specified position moving of measurement based on the previous manual measurement processes and the procedure file. The experimental results indicate that the accuracy of the proposed measurement method is less than 3um, and automatic measurement costs the processing time within 2.5s. In addition, the measurement accuracy is as high as 99.9%, which indicates that the proposed method performs a competitive result.

Citation Download Citation

Hanyu Hong, Jiaowei Shi, Xiuhua Zhang, and Qingsong Zhao "Three-dimensional measurement method for thickness of LED tape coating based on linear array spectral confocal", Proc. SPIE 11432, MIPPR 2019: Remote Sensing Image Processing, Geographic Information Systems, and Other Applications, 114320Z (14 February 2020); https://doi.org/10.1117/12.2538022

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KEYWORDS

Clouds

Confocal microscopy

Coating

Data acquisition

Light emitting diodes

Distance measurement

Solids

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