CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11382 > Article
Presentation
24 April 2020 Initial results of post-irradiation piezoresponse force microscopy characterization of piezoelectric materials (Conference Presentation)
Pradeep Ramuhalli, Shawn Reichers, Andrew Casella, Joshua Daw
Author Affiliations +
Proceedings Volume 11382, Smart Structures and NDE for Industry 4.0, Smart Cities, and Energy Systems; 1138209 (2020) https://doi.org/10.1117/12.2558242
Event: SPIE Smart Structures + Nondestructive Evaluation, 2020, Online Only
Abstract
Fundamental research to understand changes in piezoelectric properties under irradiation are required if ultrasonic sensors are to be designed and deployed for nuclear reactor in-core measurements. Previous research has examined the survivability of bismuth titanate (BiT)-based ultrasonic sensors to a total dose of up to ~1021 neutrons/cm2. This paper describes efforts to quantify the changes in piezoelectric properties in these materials using piezoresponse force microscopy (PFM). PFM measurements from non-irradiated and irradiated specimens indicated a decrease in d33 from irradiation, consistent with the observed decrease in the response of a BiT transducer over the course of the irradiation test.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Pradeep Ramuhalli, Shawn Reichers, Andrew Casella, and Joshua Daw "Initial results of post-irradiation piezoresponse force microscopy characterization of piezoelectric materials (Conference Presentation)", Proc. SPIE 11382, Smart Structures and NDE for Industry 4.0, Smart Cities, and Energy Systems, 1138209 (24 April 2020); https://doi.org/10.1117/12.2558242
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 PRESENTATION
WATCH
PRESENTATION SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
KEYWORDS
Microscopy
Sensors
Ultrasonics
Bismuth
Epoxies
Polishing
Transducers
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top