Presentation + Paper
22 April 2020 An in-situ millimeter-wave diagnostic for droplet characterization during jetting-based additive manufacturing processes
Author Affiliations +
Abstract
Additive manufacturing systems are becoming progressively more capable of printing geometrically complex structures from a wide range of materials. To ensure the print quality of these materials over the duration of the build process, there is a need for in-situ diagnostics which can provide real-time information during fabrication, as well as information that can be processed after print completion. Here we present an in-situ radio frequency diagnostic for liquid metal jetting, which employs a millimeter-wave waveguide device to monitor the impedance changes caused by moving droplets. Experimental results indicate promise for the characterization of size, timing, and motion of metal droplets in an advanced manufacturing system.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tammy Chang, Owen Mays, Saptarshi Mukherjee, Nicholas Watkins, Andrew Pascall, Jason Jeffries, and Joseph Tringe "An in-situ millimeter-wave diagnostic for droplet characterization during jetting-based additive manufacturing processes", Proc. SPIE 11380, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIV, 1138008 (22 April 2020); https://doi.org/10.1117/12.2547937
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Metals

Diagnostics

Liquids

Additive manufacturing

Waveguides

Signal detection

Tin

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