Presentation + Paper
23 March 2020 Cost-performance optimization of fine-pitch W2W bonding: functional system partitioning with heterogeneous FEOL/BEOL configurations
Dragomir Milojevic, Eric Beyne, Geert Van der Plas, Jane Wang, Peter Debacker
Author Affiliations +
Abstract
Current Wafer-to-Wafer hybrid bonding process technology allows die stacking with 3D structure pitches in range of 1μm. Independent wafer processing prior to 3D stacking enables heterogeneous CMOS process integration, where each wafer FEOL, BEOL can be optimized for a given functionality to trade-off system performance and cost. Typical functional system partitioning aims the split of the system memory from the logic. While 3D structures with coarser pitches (e.g. micro-bumps) are already used to split the last-level cache (LLC) from the rest of the system (e.g. HBMs), finer 3D structures can be used to split lower and intermediate cache memory layers (L2, L1) from the core logic. System performance gets better since delay and cache latency can be reduced. Also the system cost can be reduced, since only the core layer is now built using the most expensive CMOS process. In this article we quantify the system-level post place and route performance and area benefits of Memory-on-Logic applications using advanced CMOS processes (< 10nm) for various BEOL configuration options, i.e. the number and geometrical properties of different metal layers used in the BEOL stack.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dragomir Milojevic, Eric Beyne, Geert Van der Plas, Jane Wang, and Peter Debacker "Cost-performance optimization of fine-pitch W2W bonding: functional system partitioning with heterogeneous FEOL/BEOL configurations", Proc. SPIE 11328, Design-Process-Technology Co-optimization for Manufacturability XIV, 113280R (23 March 2020); https://doi.org/10.1117/12.2552036
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KEYWORDS
Back end of line

Semiconducting wafers

Logic

3D imaging standards

System integration

3D modeling

Metals

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