Hartmann-Shack Wavefront Sensor For Laser Diode Testing

Vincent Michau; Gerard Rousset; Bernard Riou

doi:10.1117/12.961543

6 October 1989 Hartmann-Shack Wavefront Sensor For Laser Diode Testing

Vincent Michau, Gerard Rousset, Bernard Riou

Proceedings Volume 1131, Optical Space Communication; (1989) https://doi.org/10.1117/12.961543
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

Space optical communication requires high quality collimated laser diodes. A Hartmann-Shack wavefront sensor was developed at ONERA in order to test wavefront quality of such laser beams. For this application, the Hartmann-Shack wavefront sensor offers many advantages compared to an interferometer system (simple design, compactness, no moving part). Presently, the wavefront measurement precision is limited by the quality of the reference wavefront used to calibrate the Hartmann-Shack wavefront sensor (λ/100 rms). Preliminary experimental tests was achieved. The sensitivity of the Hartmann-Shack wavefront sensor was only limited by the experiment conditions.

Citation Download Citation

Vincent Michau, Gerard Rousset, and Bernard Riou "Hartmann-Shack Wavefront Sensor For Laser Diode Testing", Proc. SPIE 1131, Optical Space Communication, (6 October 1989); https://doi.org/10.1117/12.961543

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