Open Access Paper
9 March 2020 Front Matter: Volume 11280
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 11280, including the Title Page, Copyright information, Table of Contents, Author and Conference Committee lists.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Gallium Nitride Materials and Devices XV, edited by Hiroshi Fujioka, Hadis Morkoç, Ulrich T. Schwarz, Proceedings of SPIE Vol. 11280 (SPIE, Bellingham, WA, 2020) Sevendigit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510633230

ISBN: 9781510633247 (electronic)

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445

SPIE.org

Copyright © 2020, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $21.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/20/$21.00.

Printed in the United States of America by Curran Associates, Inc., under license from SPIE.

Publication of record for individual papers is online in the SPIE Digital Library.

00004_PSISDG11280_1128001_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Altuntaş, İ., 0O

Amano, H., 15

Aragon, Andrew A., 0I

Avrutin, V., 0O

Aydınlı, A., 0O

Back, Joonho, 0H

Banayeem, Hassan, 0T

Bengtsson, Jörgen, 0M

Bharadwaj, Shyam, 10

Brodie, Miles, 1I

Bruederl, Georg, 0T

Buffolo, M., 0Z

Cadot, Stéphane, 1C

Caria, Alessandro, 0E

Chang, Feng-Pin, 1F

Chang, Tsu-Chi, 0M

Chao, Chia-Hsin, 1F

Chen, Chen, 1E

Chen, Hong, 0E

Chen, Yu-Sheng, 1F

Chichibu, Shigefusa F., 0B, 0C

Chlipala, Mikolaj, 10

Choi, Joo Won, 1E

Chu, Chun-Wen, 1F

Cohen, Daniel A., 0H

Damm, Matthias, 0T

Deki, M., 15

Demir, İ., 0O

DenBaars, Steven P., 0H

De Santi, Carlo, 0E, 0Z, 15

Dickmann, Marcel, 0C

Egger, Werner, 0C

Elagöz, S., 0O

Enatsu, Yuuki, 02

Fang, Yen-Hsiang, 1F

Feezell, Daniel F., 0I

Fu, Houqiang, 0E

Genç, M., 0O

Gheeraert, Etienne, 1C

Gülseren, O., 0O

Gür, E., 0O

Gustavsson, Johan, 0M

Haglund, Åsa, 0M

Hajdel, Mateusz, 10

Hara, Yoshihiro, 0S

Hashemi, Ehsan, 0M

Hirao, Tsuyoshi, 0S

Huang, Xuanqi, 0E

Hubbard, William, 1I

Hugenschmidt, Christoph, 0C

Ikeda, Hirotaka, 02

Ishibashi, Shoji, 0B, 0C

Ishinabe, Takayuki, 02

Iso, Kenji, 02, 09

Izumisawa, Satoru, 02

Jena, Debdeep, 10

Kagamitani, Yuji, 02

Kearns, Jared A., 0H

Kido, Yuka, 09

Kohlstedt, Raphael, 0Y

Kojima, Kazunobu, 0B

König, Harald, 0T

Koukitu, Akinori, 09

Kubota, Kohei, 02

Kunzmann, Dominic J., 0Y

Kushimoto, M., 15

Le Maoult, Corentin, 1C

Lee, SeungGeun, 0H

Lin, Chien-Chung, 1F

Lingley, Zachary, 1I

Liu, Cheng, 18

Lu, Tien-Chang, 0M

Luk, Ting S., 0I

Martin, François, 1C

Martinez, Eugénie, 1C

Masui, Shingo, 0S

Melanson, Bryan, 18

Meneghesso, Gaudenzio, 0E, 0Z, 15

Meneghini, Matteo, 0E, 0Z, 15

Mikawa, Yutaka, 02

Mishkat-Ul-Masabih, Saadat M., 0I

Miyata, Erina, 09

Mochizuki, Tae, 02

Monavarian, Morteza, 0I

Morkoç, H., 0O

Mu, Yijie, 0T

Murakami, Hisashi, 09

Muziol, Grzegorz, 10

Nagahama, Shin-ichi, 0S

Nagao, Yoji, 0S

Nakamura, Shuji, 0H

Nakatsu, Yoshitaka, 0S

Nolot, Emmanuel, 1C

Nowakowski-Szkudlarek, Krzesimir, 10

Ohtaki, Shoma, 09

Özgür, Ü., 0O

Palmquist, Nathan C., 0H

Piva, F., 0Z, 15

Schwarz, Ulrich T., 0T, 0Y

Sheremet, V., 0O

Shibata, N., 15

Shima, Kohei, 0B

Siekacz, Marcin, 10

Sin, Yongkun, 1I

Sitzman, Scott, 1I

Skierbiszewski, Czeslaw, 10

Song, Jie, 1E

Stanczyk, Szymon, 10

Taffarel, M., 0Z

Takahashi, Tatsuya, 02

Tautz, Soenke, 0T

Tomozawa, H., 15

Tsukada, Yusuke, 02

Turski, Henryk, 10

Uedono, Akira, 0B, 0C

Uhlig, Tino, 0Y

Vaufrey, David, 1C

Veksler, Dmitry, 1I

Wang, Kai, 1E

Wang, Po-Hsun, 1F

Wu, Chih-I, 1F

Wu, Dan, 1E

Xing, Huili, 10

Yanamoto, Tomoya, 0S

Yang, Shu-Mei, 1F

Zak, Mikolaj, 10

Zamperetti, Filippo, 0E

Zanoni, Enrico, 0E, 0Z, 15

Zhang, Jing, 18

Zhao, Yuji, 0E

Conference Committee

Symposium Chairs

  • Sailing He, KTH Royal Institute of Technology (Sweden) and Zhejiang University (China)

  • Yasuhiro Koike, Keio University (Japan)

Symposium Co-chairs

  • Connie J. Chang-Hasnain, University of California, Berkeley (United States)

  • Graham T. Reed, Optoelectronics Research Center, University of Southampton (United Kingdom)

Program Track Chairs

  • James G. Grote, Photonics Engineering Consultant (United States)

  • Shibin Jiang, AdValue Photonics, Inc. (United States)

Conference Chairs

  • Hiroshi Fujioka, Institute of Industrial Science, The University of Tokyo (Japan)

  • Hadis Morkoç, Virginia Commonwealth University (United States)

  • Ulrich T. Schwarz, Technische Universität Chemnitz (Germany)

Conference Program Committee

  • Frank Bertram, Otto-von-Guericke Universität Magdeburg (Germany)

  • Michal Bockowski, Institute of High Pressure Physics (Poland)

  • Raffaella Calarco, Paul-Drude-Institut für Festkörperelektronik (Germany)

  • Mitch M. C. Chou, National Sun Yat-Sen University (Taiwan)

  • Jen-Inn Chyi, National Central University (Taiwan)

  • Martin Feneberg, Otto-von-Guericke Universität Magdeburg (Germany)

  • Mitsuru Funato, Kyoto University (Japan)

  • Bernard Gil, Laboratoire Charles Coulomb (France)

  • Nicolas Grandjean, Ecole Polytechnique Fédérale de Lausanne (Switzerland)

  • Jung Han, Yale University (United States)

  • Hideki Hirayama, RIKEN (Japan)

  • Ray-Hua Horng, National Chiao Tung University (Taiwan)

  • Chih-Fang Huang, National Tsing Hua University (Taiwan)

  • Motoaki Iwaya, Meijo University (Japan)

  • Michael Kneissl, Technische Universität Berlin (Germany)

  • Elison Matioli, Ecole Polytechnique Fédérale de Lausanne (Switzerland)

  • Koh Matsumoto, Taiyo Nippon Sanso Corporation (Japan)

  • Hideto Miyake, Mie University (Japan)

  • Eva Monroy, CEA-INAC (France)

  • Yong-Tae Moon, LG Electronics Inc. (Korea, Republic of)

  • Yasushi Nanishi, Ritsumeikan University (Japan)

  • Ümit Özgür, Virginia Commonwealth University (United States)

  • Piotr Perlin, Institute of High Pressure Physics (Poland)

  • Fan Ren, University of Florida (United States)

  • Tae-Yeon Seong, Korea University (Korea, Republic of)

  • Bo Shen, Peking University (China)

  • Jong-In Shim, Hanyang University (Korea, Republic of)

  • Maria Tchernycheva, Centre de Nanosciences et de Nanotechnologies (France)

  • Akio Wakejima, Nagoya Institute of Technology (Japan)

  • Chih-Chung Yang, National Taiwan University (Taiwan)

  • Euijoon Yoon, Seoul National University (Korea, Republic of)

Session Chairs

  • 1 Growth I: Bulk Growth and Epitaxy

    Tim Wernicke, Technische Universität Berlin (Germany)

  • 2 Growth II: Characterization and Dislocations

    Shigefusa F. Chichibu, Tohoku University (Japan)

  • 3 Material Characterization: Point Defects

    Michal Bockowski, Institute of High Pressure Physics (Poland)

  • 4 VCSEL and RCLED

    Piotr Perlin, Institute of High Pressure Physics (Poland)

  • 5 LED: Light Extraction and Efficiency

    Daniel F. Feezell, The University of New Mexico (United States)

  • 6 In-Plane Laser Diodes and Nonlinear Optics

    Åsa Haglund, Chalmers University of Technology (Sweden)

  • 7 In-Plane Laser Diodes: Visible and UV

    Lucja Marona, Institute of High Pressure Physics (Poland)

  • 8 UV LED

    Andreas Waag, Technische Universität Braunschweig (Germany)

  • 9 MicroLED and Nanostructured Devices I

    Martin D. Dawson, Fraunhofer UK Research Ltd. (United Kingdom)

  • 10 MicroLED and Nanostructured Devices II

    Zlatko Sitar, North Carolina State University (United States)

  • 11 Electronic Devices

    Hiroshi Fujioka, Institute of Industrial Science, The University of Tokyo (Japan)

© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11280", Proc. SPIE 11280, Gallium Nitride Materials and Devices XV, 1128001 (9 March 2020); https://doi.org/10.1117/12.2567564
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
Back to Top