Refractive Index Profiling Of Ion Exchanged Glass Waveguides By RNF-Measurements

D. Jestel; E. Voges

doi:10.1117/12.961441

21 December 1989 Refractive Index Profiling Of Ion Exchanged Glass Waveguides By RNF-Measurements

D. Jestel, E. Voges

Proceedings Volume 1128, Glasses for Optoelectronics; (1989) https://doi.org/10.1117/12.961441
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

Two-dimensional refractive index profiles of strip waveguides are directly measured by a refractive near-field technique with a precision of Δn=0.001 and a spatial resolution of 0.8 μm. This technique is nondestructive, and requires minimal sample preparation.

Citation Download Citation

D. Jestel and E. Voges "Refractive Index Profiling Of Ion Exchanged Glass Waveguides By RNF-Measurements", Proc. SPIE 1128, Glasses for Optoelectronics, (21 December 1989); https://doi.org/10.1117/12.961441

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