Presentation + Paper
2 March 2020 Optical thickness of a plant leaf measured with THz pulse echoes
Yannick Abautret, Dominique Coquillat, Myriam Zerrad, Ryad Bendoula, Gabriel Soriano, Daphné Héran, Bruno Grèzes-Besset, Frédéric Chazallet, Claude Amra
Author Affiliations +
Abstract
We analyze Terahertz (THz) echoes by reflection on a sunflower leaf in order to evaluate the internal leaf structure (geometry, complex indices and thicknesses). The analysis is based on the thin film multilayer formalism in time and frequency domains. A high agreement is emphasized between experiment and theory, and we evaluate how realistic the multilayer solution can be in regard to our knowledge related to the sunflower leaf. A test campaign is performed in Charles Coulomb laboratory, which is equipped with the THz spectrometer.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yannick Abautret, Dominique Coquillat, Myriam Zerrad, Ryad Bendoula, Gabriel Soriano, Daphné Héran, Bruno Grèzes-Besset, Frédéric Chazallet, and Claude Amra "Optical thickness of a plant leaf measured with THz pulse echoes", Proc. SPIE 11279, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIII, 112790L (2 March 2020); https://doi.org/10.1117/12.2543710
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KEYWORDS
Terahertz radiation

Data modeling

Microscopes

Spectroscopy

Absorption

Reflection

Terahertz spectroscopy

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