Materials with vanishing real part of permittivity, also known as epsilon-near-zero, have emerged as a new paradigm to obtain large optical nonlinearities. In this region, light-matter interaction enhances significantly, which gives rise to an unprecedentedly large nonlinear phase shift. The phase sensitivity enhancement is due to the strong dispersion in this spectral region. We present nonlinear optical measurements via the Beam Deflection technique, to directly measure the spectral dependence of the ultrafast nonlinear phase shift of an Indium Tin Oxide thin film. We present simultaneously cross-phase modulation induced frequency changes that depend on how fast the nonlinear phase changes.
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