Stand-off non-destructive determination of protein level in wheat flour with a super-continuum laser

Kaiwen Guo; Tianqu Zhai; Brandon Demory; Shawn Meah; Ramon Martinez; Mohammed N. Islam; Fred Terry; Robert Maynard

doi:10.1117/12.2550400

21 February 2020 Stand-off non-destructive determination of protein level in wheat flour with a super-continuum laser

Kaiwen Guo, Tianqu Zhai, Brandon Demory, Shawn Meah, Ramon Martinez, Mohammed N. Islam, Fred Terry, Robert Maynard

Proceedings Volume 11234, Optical Biopsy XVIII: Toward Real-Time Spectroscopic Imaging and Diagnosis; 112340W (2020) https://doi.org/10.1117/12.2550400
Event: SPIE BiOS, 2020, San Francisco, California, United States

Abstract

We demonstrate an all-fiber super-continuum (SC) laser based near infrared (1160nm to 2350nm) spectroscopy system that is capable of measuring protein (gluten) levels in wheat flour, at a stand-off distance. We show that reflectance spectrum between 1160nm and 2350nm can be used to measure protein levels in wheat flour. The measured protein concentration with the partial least square regression shows a good linear correlation (R square >0.95) to the protein level measured by the Dumas method with standard error variance down to 0.5 percent. Our system could be used for non-destructive, real-time determination of the protein level of wheat flour at a stand-off distance in industrial settings such as food factories or flour milling plants.

Citation Download Citation

Kaiwen Guo, Tianqu Zhai, Brandon Demory, Shawn Meah, Ramon Martinez, Mohammed N. Islam, Fred Terry, and Robert Maynard "Stand-off non-destructive determination of protein level in wheat flour with a super-continuum laser", Proc. SPIE 11234, Optical Biopsy XVIII: Toward Real-Time Spectroscopic Imaging and Diagnosis, 112340W (21 February 2020); https://doi.org/10.1117/12.2550400

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KEYWORDS

Signal to noise ratio

Light sources

Reflectivity

Spectroscopy

Near infrared

Fiber lasers

Nondestructive evaluation

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