The Optical-Origin Drift And Its Effects On A Fringe-Counting Interferometer

Chen Ming -Yi

doi:10.1117/12.961245

3 April 1989 The Optical-Origin Drift And Its Effects On A Fringe-Counting Interferometer

Chen Ming -Yi

Proceedings Volume 1121, Interferometry '89; (1989) https://doi.org/10.1117/12.961245
Event: Interferometry '89, 1989, Warsaw, Poland

Abstract

In considering of the two boundary conditions arising in a fringe-counting interferometer(FCI): the non-zero original optical path difference(OPD) between reference and measurement arms; and the zeroed interference order corresponding to the original OPD at the begining of measurement, an amended length measurement formula and its whole-error distribution equation are derived, on which the concept of optical-origin drift(OOD) iS introduced. The effect of OOD on the measurement accuracy and the geometric design of interferometers is discussed in detail. Practical examples are also presented.

Citation Download Citation

Chen Ming -Yi "The Optical-Origin Drift And Its Effects On A Fringe-Counting Interferometer", Proc. SPIE 1121, Interferometry '89, (3 April 1989); https://doi.org/10.1117/12.961245

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available