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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in Fourth International Workshop on Pattern Recognition, edited by Xudong Jiang, Zhenxiang Chen, Guojian Chen, Proceedings of SPIE Vol. 11198 (SPIE, Bellingham, WA, 2019) Seven-digit Article CID Number. ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510631137 ISBN: 9781510631144 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445 Copyright © 2019, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $21.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/19/$21.00. Printed in the United States of America by Curran Associates, Inc., under license from SPIE. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:
AuthorsNumbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Bai, Hao, 0M Balbin, Jessie Jaye R., 03, 07, 0F Banhaw, Renalyn L., 0F Bilal, Hazrat, 0T Borja, Carlo Reese F., 07 Cao, Guo, 05 Cao, Xu, 0C Catapang, Justin Llyod, 0K Chan, Yu-Sheng, 0N Chen, Chao, 0S Chen, Jian, 0I Chen, Tianping, 0B Cheng, Jen-Shun, 0N Chi, Yingying, 0R Chien, Wei-Che, 02 Chung, Kuo-Liang, 02, 0N Cui, Wenpeng, 0R de Dios, Neil Leander A., 07 Deng, Kai, 0P Deng, Tingqiang, 06 Ding, Hui, 0E Du, Cuibing, 0S Feng, Fan, 0L Gao, Hewei, 0V Garcia, Ramon, 0K Ge, Hailong, 0X Gu, Xiaoqing, 0Z Guo, Kailing, 12 Guo, Xingchen, 0Q He, Jie, 0G Hong, Haifeng, 13 Hong, Wenjing, 0H Huan, Jiajia, 13 Huang, Mengtao, 08 Huang, Yuzhi, 0P Ibarra, Joseph Bryan G., 07 Jiang, Junxin, 11 Jiang, Rifeng, 0D Lee, Yu-Ling, 02 Li, Chunguo, 06 Li, Meilin, 0C Li, Rui, 06 Li, Xuanxi, 0Z Li, Xuesong, 05 Li, Zhanjun, 0H Liang, Yongbo, 05 Liao, Chi-Huang, 0N Liao, Rutian, 06 Liu, De-Hao, 0N Liu, Gang, 0D, 0P Liu, Li-Ting, 0N Liu, Rui, 0R Liu, Si, 0J Liu, Yang, 06 Liu, Yuxiang, 0U Long, Xin, 0U Ma, Jie, 0L Ma, Qian, 0C Ma, Qingzeng, 0X Ma, Xinqiang, 0X Ma, Yuanyuan, 0E Manalili, Emmanuelle Allyanna, 0K Martin, Christian Raye O., 0F Mordido, McTroy John S., 03 Ning, Dunbo, 0D Pangilinan, Paul Nicko G., 07 Pelayo, Jhohn Ramses B., 03 Peng, Yang, 0U, 0W Qian, Ying, 10 Qin, Minying, 04 Qin, Xianxiang, 0B, 0C Qing, Zepeng, 0A Quan, Siwen, 0L Rivera, Joanne Lorie R., 0F Salapantan, Abegail, 0K Sen, Liu, 0X Shao, Yan, 0H Shi, Yuliang, 0A Sui, Yu, 13 Sun, Jiachi, 0C Tacderas, Ivan Hur Y., 03 Tang, Hui, 0G Tornea, Jucel Adelyn F., 03 Valiente, Leonardo D., 03, 0K Victorino, Jeffrey R. R., 0F Wang, Chuyi, 0D Wang, Di, 10 Wang, Guangyue, 0W Wang, Lu, 08 Wang, Luyang, 0T Wang, Peng, 0B Wang, Sen, 0V Wang, Sijuan, 0O Wang, Xiaoxue, 0Z Wang, Yang, 0J Wei, Cheng, 0X Wei, Lin, 0G Xiao, Yingchao, 0E Xiao, Yunzhe, 11 Xing, Xiaofen, 12 Xing, Yuxiang, 0V Xu, Kai, 11 Xu, Qiucheng, 0E Xu, Xiangmin, 12 Yan, Miguel Francis B., 07 Yang, Liu, 09 Yang, Luxi, 06 Yang, Yicai, 12 Yang, Yingming, 10 Yang, Zhe, 06 Yin, Baoqun, 0T Yin, Yuting, 04 You, Zhiqiang, 0O Yu, Chao-Liang, 02 Yu, Kun, 0L Yu, Wangsheng, 0B Yu, Yibiao, 0Q Yuan, Yidong, 0R Zhai, Qiang, 0T Zhan, Enqi, 0J Zhang, Haifeng, 0R Zhang, Hao, 0V Zhang, Jun, 0G Zhang, Li, 0V Zhang, Maojun, 0U, 0W Zhang, Pengfei, 0W Zhang, Sheng, 0S Zhang, Xiaohui, 13 Zhang, Xi-Wen, 0M Zhang, Xudong, 10 Zhang, Yang, 0Y Zhao, Qiang, 0A Zhao, Zhiyang, 0Y Zheng, Jianbin, 0J Zheng, Youfeng, 0G Zhong, Jin, 09 Zhu, Nan, 04 Zhu, Xianxun, 0Y Zou, Huanxin, 0B, 0C Zuo, Jiancun, 0Y Conference CommitteeInternational Advisory Committees
Conference Chairs
Program Chairs
Local Organizing Chair Technical Committees
Session Chairs
IntroductionIn recent years, pattern recognition has become a hot research branch thanks to the recent advances of deep machine learning driven by big data. In light of the fast-paced advancements in pattern recognition taking place all over the world, it is of great interest to keep an eye on state-of-the-art research and development and to facilitate collaboration in multidisciplinary research areas. With this end in view, it was a great pleasure for me to invite you to participate in the 4th International Workshop on Pattern Recognition held during June 28-30, 2019 in Nanjing, China. The aim of the conference is to address and deliberate on the latest technical status and recent trends in the research, developments and applications of pattern recognition. This conference has been designed with the view of providing an opportunity for scientists, engineers, industrialists, students and other professionals from all over the world to interact and exchange their new ideas and research outcomes for future collaboration. This year, IWPR has solicited 59 submitted papers from various countries all over the world. The proceedings of IWPR 2019 contain 38 selected papers from the conference that have been presented at the conference either orally or via poster sessions. They provide up-to-date, comprehensive and worldwide state-of-the-art knowledge and techniques in this field. Each contributed paper was rigorously peer-reviewed by international reviewers who were drawn from the organizing and advisory committee members and external reviewers in related fields from all over the world. The proceedings cover the following specific areas: pattern recognition, target detection, image transformation and analysis, image detection technology and application, image processing and application, signal analysis and processing, and computer science and engineering. On behalf of the organizing committee, we’d like to express our heartful gratitude to all the reviewers for their great professionalism and efforts. Also, thanks to all the participants and sponsors for their valuable contributions and support of IWPR 2019. General Chairs Xudong Jiang |