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6 September 2019 Fibonacci subterahertz imaging: features and applications
Domas Jokubauskis, Linas Minkevičius, Mindaugas Karaliūnas, Irmantas Kašalynas, Simonas Indrišiūnas, Gediminas Račiukaitis, Gintaras Valušis
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Proceedings Volume 11124, Terahertz Emitters, Receivers, and Applications X; 111240X (2019) https://doi.org/10.1117/12.2529012
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States
Abstract
Fibonacci or bifocal terahertz (THz) imaging based on silicon diffractive zone plate in a continuous wave mode at 0.6 THz is demonstrated. Silicon as a low absorbing material was used in the laser ablation process to fabricate the Fibonacci structures. Zone plates were designed by the three-dimensional finite-difference time-domain method. To illustrate the Fibonacci focusing, the performance was studied both theoretically and experimentally by determining spatial profiles, the distance between the foci and the focal depth at frequencies of 0.3 THz and 0.6 THz. Terahertz images of various packaged objects at the 0.6 THz frequency were simultaneously recorded with the spatial resolution of wavelength in two different planes separated by 7 mm distance. Imaging performance using the Fibonacci lens is compared with the operation of the conventional silicon phase zone plate.
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Domas Jokubauskis, Linas Minkevičius, Mindaugas Karaliūnas, Irmantas Kašalynas, Simonas Indrišiūnas, Gediminas Račiukaitis, and Gintaras Valušis "Fibonacci subterahertz imaging: features and applications", Proc. SPIE 11124, Terahertz Emitters, Receivers, and Applications X, 111240X (6 September 2019); https://doi.org/10.1117/12.2529012
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Semiconductor lasers
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