X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development

A. Jafari; F. E. Christensen; S. Massahi; S. Svendsen; L. M. Vu; P. L. Henriksen; B. Shortt; M. Krumrey; L. Cibik; E. Handick; D. D. M. Ferreira

doi:10.1117/12.2527557

9 September 2019 X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development

A. Jafari, F. E. Christensen, S. Massahi, S. Svendsen, L. M. Vu, P. L. Henriksen, B. Shortt, M. Krumrey, L. Cibik, E. Handick, D. D. M. Ferreira

Author Affiliations +

Proceedings Volume 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX; 111191K (2019) https://doi.org/10.1117/12.2527557
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

X-ray reflectivity (XRR) characterization of X-ray mirrors is an essential step for designing space telescopes and instruments. We report on production and characterization of platinum thin films coated onto a at thick glass substrate for evaluating measurement results obtained using several XRR systems. The main objective of this study is to compare the XRR results measured using facilities at the Technical University of Denmark, DTU Space, and BESSY II for the Advanced Telescope for High-ENergy Astrophysics (ATHENA) mission funded by the European Space Agency, ESA. This sample will be used as a reference sample for testing and calibrating similar measurements at relevant X-ray facilities. This information demonstrates the stable performance of the platinum mirror as a reference sample. Also, the overlayer effect on mirror performance is investigated.

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A. Jafari, F. E. Christensen, S. Massahi, S. Svendsen, L. M. Vu, P. L. Henriksen, B. Shortt, M. Krumrey, L. Cibik, E. Handick, and D. D. M. Ferreira "X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development", Proc. SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 111191K (9 September 2019); https://doi.org/10.1117/12.2527557

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