Calculation of intensity distribution from a wavefront using ray-counting method

Manuel Campos-García; Ángel Eugenio Martínez-Rodríguez; Fermín Salomon Granados-Agustín

doi:10.1117/12.2526245

21 June 2019 Calculation of intensity distribution from a wavefront using ray-counting method

Manuel Campos-García, Ángel Eugenio Martínez-Rodríguez, Fermín Salomon Granados-Agustín

Proceedings Volume 11057, Modeling Aspects in Optical Metrology VII; 110571L (2019) https://doi.org/10.1117/12.2526245
Event: SPIE Optical Metrology, 2019, Munich, Germany

Abstract

In optics, there are two notable groups of wavefront recovery techniques: the interferometric and geometric ones. Some intensity patterns obtained with these techniques can be quickly related to typical aberrations such as coma or astigmatism. However, the patterns obtained with phase retrieval techniques have not been studied yet. In this work, we proposed and developed a computational tool to obtain intensity distributions in any perpendicular plane of well-known and well-behaved beams, such as parabolic or Gaussian beam wavefronts.

Citation Download Citation

Manuel Campos-García, Ángel Eugenio Martínez-Rodríguez, and Fermín Salomon Granados-Agustín "Calculation of intensity distribution from a wavefront using ray-counting method", Proc. SPIE 11057, Modeling Aspects in Optical Metrology VII, 110571L (21 June 2019); https://doi.org/10.1117/12.2526245

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available