Improvement of authenticity inspection accuracy using logo region detection

Ryo Inoue; Tomio Goto; Satoshi Hirano; Son Lam Phung

doi:10.1117/12.2521430

22 March 2019 Improvement of authenticity inspection accuracy using logo region detection

Ryo Inoue, Tomio Goto, Satoshi Hirano, Son Lam Phung

Proceedings Volume 11049, International Workshop on Advanced Image Technology (IWAIT) 2019; 110490R (2019) https://doi.org/10.1117/12.2521430
Event: 2019 Joint International Workshop on Advanced Image Technology (IWAIT) and International Forum on Medical Imaging in Asia (IFMIA), 2019, Singapore, Singapore

Abstract

Manufacturing technology for counterfeit brand items has advanced in recent years, and it is becoming very difficult for humans to identify counterfeit products. In this paper, we propose an inspection system using image matching methods to realize the authenticity inspection of brand logos through image recognition. In the first experiment, we compare the similarity evaluation performance by NCC (Normalized Cross-Correlation) and POC (Phase-Only Correlation) using images of actual brand products. In the next experiment, we confirm the effectiveness of logo region detection processing using edge images as preprocessing of image matching with the aim of improving inspection accuracy of images containing many background components. Experimental results show that it is possible to separate genuine and fake more accurately by evaluating similarity by POC. Moreover, we confirmed that by adding the logo region detection processing, the background component of the image was reduced and highly accurate inspection was possible.

Citation Download Citation

Ryo Inoue, Tomio Goto, Satoshi Hirano, and Son Lam Phung "Improvement of authenticity inspection accuracy using logo region detection", Proc. SPIE 11049, International Workshop on Advanced Image Technology (IWAIT) 2019, 110490R (22 March 2019); https://doi.org/10.1117/12.2521430

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Inspection

Image processing

Binary data

Fourier transforms

Manufacturing

Target detection

Image analysis

Show All Keywords

Keywords/Phrases

Search In:

Publication Years