High-fidelity quantum tomography with imperfect measurements

B. I. Bantysh; D. V. Fastovets; Yu. I. Bogdanov

doi:10.1117/12.2522413

15 March 2019 High-fidelity quantum tomography with imperfect measurements

B. I. Bantysh, D. V. Fastovets, Yu. I. Bogdanov

Proceedings Volume 11022, International Conference on Micro- and Nano-Electronics 2018; 110222N (2019) https://doi.org/10.1117/12.2522413
Event: The International Conference on Micro- and Nano-Electronics 2018, 2018, Zvenigorod, Russian Federation

Abstract

In the current work we address the problem of quantum process tomography (QPT) in the case of imperfect preparation and measurement of the states which are used for QPT. The fuzzy measurements approach which helps us to efficiently take these imperfections into account is considered. However, to implement such a procedure one should have a detailed information about the errors. An approach for obtaining the partial information about them is proposed. It is based on the tomography of the ideal identity gate. This gate could be implemented by performing the measurement right after the initial state preparation. By using the result of the identity gate tomography we were able to significantly improve further QPT procedures. The proposed approach has been tested experimentally on the IBM superconducting quantum processor. As a result, we have obtained an increase in fidelity from 89% to 98% for Hadamard transformation and from 77% to 95% for CNOT gate.

Citation Download Citation

B. I. Bantysh, D. V. Fastovets, and Yu. I. Bogdanov "High-fidelity quantum tomography with imperfect measurements", Proc. SPIE 11022, International Conference on Micro- and Nano-Electronics 2018, 110222N (15 March 2019); https://doi.org/10.1117/12.2522413

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