Paper
12 December 2018 Applications of InGaAs near-infrared linear scanning camera in solar cell inspection
Cheng Fei, Yongfu Li, Daming Chen, Benya Yang, Tingfa Zhang, Shuzhen Fan, Jiaxiong Fang
Author Affiliations +
Proceedings Volume 10846, Optical Sensing and Imaging Technologies and Applications; 1084613 (2018) https://doi.org/10.1117/12.2504337
Event: International Symposium on Optoelectronic Technology and Application 2018, 2018, Beijing, China
Abstract
An InGaAs near-infrared linear scanning camera was developed based on the InGaAs near-infrared linear detector array, it has a resolution of 256×1 and an adjustable exposure time from 20 μs to 2 ms. The electroluminescence (EL) and photoluminescence (PL) of different kinds of solar cells were observed by the InGaAs near-infrared linear scanning camera and the common used Si-CCD linear scanning camera, and the inspection results of these two cameras were compared. The results show that the InGaAs near-infrared linear scanning camera can obtain a clear image with an exposure time of 2 ms, much faster than the common used Si-CCD linear scanning camera can. Therefore, the InGaAs near-infrared linear scanning camera has the advantage of high efficiency in solar cell inspection.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cheng Fei, Yongfu Li, Daming Chen, Benya Yang, Tingfa Zhang, Shuzhen Fan, and Jiaxiong Fang "Applications of InGaAs near-infrared linear scanning camera in solar cell inspection", Proc. SPIE 10846, Optical Sensing and Imaging Technologies and Applications, 1084613 (12 December 2018); https://doi.org/10.1117/12.2504337
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Solar cells

Cameras

Indium gallium arsenide

Electroluminescence

Inspection

Silicon solar cells

Copper indium gallium selenide

Back to Top