Composite Ag-Ni metal mesh based transparent conductive film for electromagnetic interference shielding application

Shiyu Chen; Yanhua Liu; Feng Wu; Su Shen

doi:10.1117/12.2505871

24 January 2019 Composite Ag-Ni metal mesh based transparent conductive film for electromagnetic interference shielding application

Shiyu Chen, Yanhua Liu, Feng Wu, Su Shen

Author Affiliations +

Proceedings Volume 10840, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Micro- and Nano-Optics, Catenary Optics, and Subwavelength Electromagnetics; 1084006 (2019) https://doi.org/10.1117/12.2505871
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China

Abstract

With the development of wireless microwave electronic devices, electromagnetic interference (EMI) is a new kind of pollution that is becoming increasingly prevalent and has affected the performance of the electronic devices and the human health. Thus,the transparent EMI shielding film is a key component for many practical applications. Conventional methods for the fabrication of transparent EMI film are time-consuming and costly for their employing expensive vacuum-based process. By combination of the scrape and selective electroplating techniques, a vacuum sputtering/evaporation-free processing is explored for the fabrication of high-performance metal mesh based TCF. The fabricated composite Ag-Ni mesh TCF exhibits ultra-low sheet electrical resistance (Rs=0.07Ω sq−1) at average transmittance of 70% in the visible region. The measured shielding efficiency can be greater than 30dB in X-band. Both experimental and theoretical results are given in the paper. By using the proposed method, TCF based EMI film can be easily fabricated for mass-manufacturing.

Citation Download Citation

Shiyu Chen, Yanhua Liu, Feng Wu, and Su Shen "Composite Ag-Ni metal mesh based transparent conductive film for electromagnetic interference shielding application", Proc. SPIE 10840, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Micro- and Nano-Optics, Catenary Optics, and Subwavelength Electromagnetics, 1084006 (24 January 2019); https://doi.org/10.1117/12.2505871

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