Presentation + Paper
7 September 2018 Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions
K. Zembrzycki, T. A. Kowalewski, S. Pawlowska, J. Chrzanowska-Gizynska, M. Nowak, M. Walczak, F. Pierini
Author Affiliations +
Abstract
Materials containing suspended micro- or nanomaterials are used extensively in multiple fields of research and industry. In order to understand the behavior of nanomaterials suspended in a liquid, the knowledge of particle stability and mobility is fundamental. For this reason, it is necessary to know the nanoscale solid-solid interaction and the hydrodynamic properties of the particles. In the presented research we used a hybrid Atomic Force Microscope coupled with Optical Tweezers system to measure the femtonewton scale interaction forces acting between single particles and the walls of a microchannel at different separation distances and environmental conditions. We show an important improvement in a typical detection system that increases the signal to noise ratio for more accurate position detection at very low separation distances.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Zembrzycki, T. A. Kowalewski, S. Pawlowska, J. Chrzanowska-Gizynska, M. Nowak, M. Walczak, and F. Pierini "Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions", Proc. SPIE 10723, Optical Trapping and Optical Micromanipulation XV, 1072323 (7 September 2018); https://doi.org/10.1117/12.2319732
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KEYWORDS
Particles

Optical tweezers

Signal to noise ratio

Atomic force microscopy

Spatial filters

Electronic filtering

Nanomaterials

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