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21 November 2017 Absolute metrology for space interferometers
Yves Salvadé, Alain Courteville, René Dändliker
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Proceedings Volume 10569, International Conference on Space Optics — ICSO 2000; 1056905 (2017) https://doi.org/10.1117/12.2307951
Event: International Conference on Space Optics 2000, 2000, Toulouse Labège, France
Abstract
The crucial issue of space-based interferometers is the laser interferometric metrology systems to monitor with very high accuracy optical path differences. Although classical high-resolution laser interferometers using a single wavelength are well developed, this type of incremental interferometer has a severe drawback: any interruption of the interferometer signal results in the loss of the zero reference, which requires a new calibration, starting at zero optical path difference. We propose in this paper an absolute metrology system based on multiplewavelength interferometry.
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Yves Salvadé, Alain Courteville, and René Dändliker "Absolute metrology for space interferometers", Proc. SPIE 10569, International Conference on Space Optics — ICSO 2000, 1056905 (21 November 2017); https://doi.org/10.1117/12.2307951
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KEYWORDS
Interferometry
Interferometers
Metrology
Nd:YAG lasers
Calibration
Wavelength tuning
Space telescopes
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