Study on the near-field non-linearity (SMILE) of high power diode laser arrays

Hongyou Zhang; Yangtao Jia; Changxuan Li; Chung-en Zah; Xingsheng Liu

doi:10.1117/12.2287580

20 February 2018 Study on the near-field non-linearity (SMILE) of high power diode laser arrays

Hongyou Zhang, Yangtao Jia, Changxuan Li, Chung-en Zah, Xingsheng Liu

Proceedings Volume 10513, Components and Packaging for Laser Systems IV; 105131R (2018) https://doi.org/10.1117/12.2287580
Event: SPIE LASE, 2018, San Francisco, California, United States

Abstract

High power laser diodes have been found a wide range of industrial, space, medical applications, characterized by high conversion efficiency, small size, light weight and a long lifetime. However, due to thermal induced stress, each emitter in a semiconductor laser bar or array is displaced along p-n junction, resulting of each emitter is not in a line, called Near-field Non-linearity. Near-field Non-linearity along laser bar (also known as “SMILE”) determines the outcome of optical coupling and beam shaping [1]. The SMILE of a laser array is the main obstacle to obtain good optical coupling efficiency and beam shaping from a laser array. Larger SMILE value causes a larger divergence angle and a wider line after collimation and focusing, respectively. In this letter, we simulate two different package structures based on MCC (Micro Channel Cooler) with Indium and AuSn solders, including the distribution of normal stress and the SMILE value. According to the theoretical results, we found the distribution of normal stress on laser bar shows the largest in the middle and drops rapidly near both ends. At last, we did another experiment to prove that the SMILE value of a laser bar was mainly affected by the die bonding process, rather than the operating condition.

Citation Download Citation

Hongyou Zhang, Yangtao Jia, Changxuan Li, Chung-en Zah, and Xingsheng Liu "Study on the near-field non-linearity (SMILE) of high power diode laser arrays", Proc. SPIE 10513, Components and Packaging for Laser Systems IV, 105131R (20 February 2018); https://doi.org/10.1117/12.2287580

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