Analysis Of Finlines On Biaxial Anisotropic Dielectric

F. A. F. Tejo; A. G. d'Assuncao; A. J. Giarola

doi:10.1117/12.978429

18 November 1989 Analysis Of Finlines On Biaxial Anisotropic Dielectric

F. A. F. Tejo, A. G. d'Assuncao, A. J. Giarola

Proceedings Volume 1039, 13th Intl Conf on Infrared and Millimeter Waves; (1989) https://doi.org/10.1117/12.978429
Event: 13th International Conference on Infrared and Millimeter Waves, 1987, Honolulu, HI, United States

Abstract

An analysis of finlines on layered biaxial aniso-tropic dielectric substrate using the finite element method is developed. The spurious modes are eliminated by imposing the restriction ∫Ω∇.Η2dΩ = 0 to the used functional with a consequent reduction of matrix size of the resultant eigenvalue problem. The basic formulation is presented and the eigenvalue equation for the calculation of the effective dielectric constant is given.

Citation Download Citation

F. A. F. Tejo, A. G. d'Assuncao, and A. J. Giarola "Analysis Of Finlines On Biaxial Anisotropic Dielectric", Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); https://doi.org/10.1117/12.978429

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