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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in Advances in X-Ray/EUV Optics and Components XII, edited by Christian Morawe, Ali M. Khounsary, Shunji Goto, Proceedings of SPIE Vol. 10386 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number. ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510612297 ISBN: 9781510612303 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2017, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/17/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library.
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AuthorsNumbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Akan, Rabia, 0S Bhartiya, S., 05 Boesenberg, Ulrike, 0A Cao, Leifeng, 0Q Carau, Damien, 03, 0V Chen, Pice, 0M, 0Z Chen, Sharon, 0D Cheng, Jinming, 04 Cheng, Xianchao, 04 Cordier, Mark, 0D Dhamgaye, Vishal, 0B Dhawan, R., 05 Eberl, Christian, 08 Fabris, Nicola, 0R Falkenberg, Gerald, 0A Frassetto, Fabio, 0R Galtier, Eric C., 0A Gao, Ya, 0M Garrevoet, Jan, 0A Giakoumidis, Stylianos, 0A, 0S Gome, A., 05 Goto, Takumi, 0E Hashizume, Hirokazu, 0E Ishikawa, Shin-nosuke, 0E Ishikawa, Tetsuya, 0C Jung, Il Woong, 0M, 0Z Kime, Ayumi, 0E Kohmura, Yoshiki, 0C, 0E Koyama, Takahisa, 09 Krebs, Hans-Ulrich, 08 Lau, S. H., 0D Laundy, David, 0B Lee, Hae Ja, 0A Lewis, Sylvia J. Y., 0D Li, Hailiang, 0Q Li, Zhilong, 0M Liu, Dongbing, 04 Lopez, Daniel, 0M, 0Z Lum, P., 07 Lyon, Alan, 0D Maezawa, Tadakazu, 0E Majhi, A., 05 Matsuyama, Satoshi, 0C, 0E Mimura, Hidekazu, 09 Miotti, Paolo, 0R Miyake, Akira, 0E Morawe, Christian, 03, 0V Motoyama, Hiroto, 09 Mu, Jian, 04 Nagler, Bob, 0A Narukage, Noriyuki, 0E Nayak, M., 05 Nolte, Stefan, 0A Ohashi, Haruhiko, 09 Osterhoff, Markus, 08 Owada, Shigeki, 09 Padmore, H. A., 07 Pape, Ian, 0B Parfeniukas, Karolis, 0A, 0S Peffen, Jean-Christophe, 03, 0V Poletto, Luca, 0R Pradhan, P. C., 05 Rahomäki, Jussi, 0A Rai, S. K., 05 Rau, Christoph, 0A Reddy, V. R., 05 Reynolds, David, 0D Rödel, Christian, 0A Sahoo, P. K., 05 Sakao, Taro, 0E Sano, Yasuhisa, 0C Sawhney, Kawal, 0B Scholz, Maria, 0A Schroer, Christian G., 0A Schropp, Andreas, 0A Schwartz, C. P., 0Z Seiboth, Frank, 0A Semenov, Vladimir A., 0D Seshadri, Srivatsan, 0D Shenoy, Gopal K., 0M, 0Z Singh, A., 05 Soltau, Jakob, 08 Spink, Richard I., 0D Stripe, Benjamin, 0D Suematsu, Yoshinori, 0E Tan, Bozhong, 04 Tono, Kensuke, 09 Turchini, Stefano, 0R Ullsperger, Tobias, 0A Vogt, Ulrich, 0A, 0S Voronov, D. L., 07 Wagner, Ulrich, 0A Walko, Donald A., 0M, 0Z Wang, Jin, 0M, 0Z Wei, Lai, 0Q Wittwer, Felix, 0A Wünsche, Martin, 0A Xie, Changqing, 0Q Yabashi, Makina, 09, 0C Yamada, Jumpei, 0C, 0E Yamauchi, Kazuto, 0C, 0E Yang, Qingguo, 04 Yasuda, Shuhei, 0C, 0E Yun, Wenbing, 0D Zhu, Xiaoli, 0Q Zuppella, Paola, 0R Conference CommitteeConference Chairs
Program Track Chair Conference Program Committee
Session Chairs
IntroductionThis volume contains papers presented at the conference on Advances in XRay/EUV Optics and Components XII, held 8–9 August 2017 in San Diego, California, USA, as part of the 2017 SPIE Optics + Photonics symposium. The conference was composed of seven oral sessions: Multilayers, Focusing, Mirrors, Beamlines and Facilities, Opto-Thermomechanics, Crystals, and Gratings. The focus of the conference was on technological developments in X-ray/EUV optics, covering a wide spectral range. Topics related to metrology, laboratory-based xray sources, computational methods for x-ray optics, and x-ray nanoimaging were presented in independent conferences at the same symposium. Scheduled for one and half days of oral presentations, and accompanied by an evening poster session, the conference highlighted recent developments in the field and stimulated lively discussions among participants. We would like to thank the authors, speakers, session chairs, programme committee members, and the conference participants for their contributions, and the SPIE staff for their help in the organization of the conference. Christian Morawe Ali M. Khounsary Shunji Goto |
