Paper
10 April 1989 A Repair Machine For VLSI Using Laser Induced Micro-Chemistry
G. Auvert, D. Tonneau, Y. Guern, G. Pelous
Author Affiliations +
Proceedings Volume 1022, Laser Assisted Processing; (1989) https://doi.org/10.1117/12.950101
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
Laser assisted direct writing for in situ etching and deposition may find applications in integrated circuit repair or adjustment. Recent work, performed by this team, on basic processes for deposition of metals and insulators and for etching materials currently in use in microelectronics, will be reviewed. This paper is to describe the last developments of an IC repair prototype, designed to draw 2 micron wide lines on Silicon using a focused CW Argon ion laser beam. As deposition mechanism is mainly pyrolytic, deposit shapes have been evaluated starting from experimental deposition kinetics and 3D finite element temperature distribution computation. General concepts of the machine to meet the conflicting requirements of obtaining a micron size laser spot over a full 150 mm Si wafer enclosed in a controlled atmosphere will be presented. Possible processes will be outlined and applications reviewed.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Auvert, D. Tonneau, Y. Guern, and G. Pelous "A Repair Machine For VLSI Using Laser Induced Micro-Chemistry", Proc. SPIE 1022, Laser Assisted Processing, (10 April 1989); https://doi.org/10.1117/12.950101
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Cited by 1 scholarly publication.
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KEYWORDS
Silicon

Nickel

Metals

Temperature metrology

Dielectrics

Laser processing

Etching

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