Truncated pyramid artifact for performance evaluation experiments on laser line scanner

Sen Zhou; Jian Xu; Tao Lei; Chen Long; Tang Jing

doi:10.1117/12.2248455

24 November 2016 Truncated pyramid artifact for performance evaluation experiments on laser line scanner

Sen Zhou, Jian Xu, Tao Lei, Chen Long, Tang Jing

Proceedings Volume 10023, Optical Metrology and Inspection for Industrial Applications IV; 1002329 (2016) https://doi.org/10.1117/12.2248455
Event: SPIE/COS Photonics Asia, 2016, Beijing, China

Abstract

Non-contact measurement techniques using 3D laser scanning have the power to deliver tremendous benefits to most notably manufacturing, and have the advantage of high speed and high detail output. However, procedures for evaluation and verification of non-contact laser line scanner have not been well-established because of many influencing factors like scan depth, incident angle, probe head orientation and surface properties. A truncated pyramid artifact representation of five- planar with different included angles was designed and used to straightforwardly identify the influence of in-plane and out-of-plane angle, as well as scan depth on dimensional measurement accuracy of the laser scanner. Then, a series of easy, fast and representative experiments, based on this simple artifact, were performed on a commercial laser line scanner, and found that the output of this scanner can be improved for metrology applications after calibration.

Citation Download Citation

Sen Zhou, Jian Xu, Tao Lei, Chen Long, and Tang Jing "Truncated pyramid artifact for performance evaluation experiments on laser line scanner", Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 1002329 (24 November 2016); https://doi.org/10.1117/12.2248455

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