Paper
16 January 1989 Application Of Photothermoelastic Effect To Noncontact Inspection Of Soldered Connections
K. Hane, S. Hattori
Author Affiliations +
Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947638
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Abstract
Recently, thermoelastic vibration due to periodic laser irradiation on the plate-like sample has been observed in the photoacoustic experiments, and it has been used for the nondestructive evaluations of layered materials and clamped samples. By using the effect, we propose a new inspection method for soldered connection, in which the mechanical condition of soldering can be tested nondestructively. Surface of the IC package pin is irradiated periodically by heating laser to cause the thermoelastic vibration of the pin. In order to measure the vibration, probe laser beam impinges on the surface of the pin. The micro-translation of the speckle pattern, which is produced by the scattering reflection of the probe laser, is detected by a photo-diode. Unbonded pin of the IC package is distinguished from the well-bonded pins by the enhanced vibration. The characteristics of the pin vibration are examined experimentally under several conditions, and also they are considered theoretically from the thermoelastic bending point of view. The proposed technique will be useful for the automated inspection of the soldered connection used in the printed circuit board.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. Hane and S. Hattori "Application Of Photothermoelastic Effect To Noncontact Inspection Of Soldered Connections", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); https://doi.org/10.1117/12.947638
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KEYWORDS
Laser beam diagnostics

Inspection

Optical testing

Printed circuit board testing

Laser metrology

Laser irradiation

Photoacoustic spectroscopy

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