Scanning Tunneling Microscopy: Instrument Design And Application In Air And Vacuum

Sang-il Park; J Nogami; C F Quate

doi:10.1117/12.944500

12 July 1988 Scanning Tunneling Microscopy: Instrument Design And Application In Air And Vacuum

Sang-il Park, J Nogami, C F Quate

Proceedings Volume 0897, Scanning Microscopy Technologies and Applications; (1988) https://doi.org/10.1117/12.944500
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

The scanning tunneling microscope(STM) has the capability of mapping the topography of a surface with unprecedented resolution in both vertical and lateral directions. STM has been used to obtain real space images of individual atoms on a surface. In this paper we review the principles and technical aspects of STM, and give some examples of its applications both in air and vacuum. These include images of graphite, silicon, and indium on silicon. Several techniques of digital image processing developed to facilitate the analysis of STM data are also described.

Citation Download Citation

Sang-il Park, J Nogami, and C F Quate "Scanning Tunneling Microscopy: Instrument Design And Application In Air And Vacuum", Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); https://doi.org/10.1117/12.944500

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