Exposure Fields In Low Energy Flash Radiography

Richard G. Audette; Mark J. McFadden; Edwin A. Webster Jr.

doi:10.1117/12.942221

4 February 1988 Exposure Fields In Low Energy Flash Radiography

Richard G. Audette, Mark J. McFadden, Edwin A. Webster Jr.

Proceedings Volume 0832, High Speed Photography, Videography, and Photonics V; (1988) https://doi.org/10.1117/12.942221
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

Flash radiography has been used for many years to measure ballistic phenomena and explosive events which are impossible to capture with high speed photography due to the large amount of smoke and flash usually associated with these events. The basic system consists of a pulse generator, high voltage power supply, and a cold cathode field emission x-ray tube. This paper will deal with the exposure fields around 150, 180, and 300 kV Hewlett Packard x-ray tubes. Although the dosage of each of these systems is described in the system characteristics, it is described only in terms of an exposure at one given distance for each energy level, i.e., 40 mR at 20cm from the 150 kV tubehead. This paper will examine from a safety standpoint, the exposure obtained anywhere within a 360° field and will compare these results with the yearly dosage permitted by the U.S. government. This study will supply quantitative data to aid in determining the adequacy of standard operating procedures for flash x-ray equipment.

Citation Download Citation

Richard G. Audette, Mark J. McFadden, and Edwin A. Webster Jr. "Exposure Fields In Low Energy Flash Radiography", Proc. SPIE 0832, High Speed Photography, Videography, and Photonics V, (4 February 1988); https://doi.org/10.1117/12.942221

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