Paper
9 August 1988 Surface Texture And Imaging Quality Of Mirrors
Lionel R. Baker
Author Affiliations +
Abstract
Although optical systems designed to image extended fields, such as photographic and copying lenses, can tolerate clearly visible degrees of surface contamination and damage, such as dust and scratches, mirrors and lenses required to produce diffraction limited images of point sources require near perfect surfaces. Every particle of contamination and surface defect will create its own diffraction pattern in the image plane, thus transferring information about the surface itself rather than the object under study. This paper reviews techniques currently used for measurement of surface texture and image quality and describes a new approach based on comparing a test mirror with a reference component having known characteristics. The method of operation and the principal design features of this comparator approach are described. If this method is accepted, it may in future be possible to define a code of practice and standards relating to the roughness, flaws and image forming quality of mirrors.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lionel R. Baker "Surface Texture And Imaging Quality Of Mirrors", Proc. SPIE 0830, Grazing Incidence Optics for Astronomical and Laboratory Applications, (9 August 1988); https://doi.org/10.1117/12.942157
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Image quality

Calibration

Diffraction

Microscopes

Reflectivity

Contamination

RELATED CONTENT

Surface Quality Assessment By Image Comparison
Proceedings of SPIE (January 01 1987)
Stray Light Problems, Concepts, And Tools
Proceedings of SPIE (June 03 1987)
Automated Measurement Of Surface Texture
Proceedings of SPIE (May 18 1987)
Image quality, surface statistics, and all that
Proceedings of SPIE (February 01 1994)

Back to Top