Paper
10 November 1986 Characterization Of The Microstructure Of Optical Fibres
S. Neffe, M. Szustakowski
Author Affiliations +
Proceedings Volume 0670, Optical Fibres and Their Applications IV; (1986) https://doi.org/10.1117/12.938974
Event: Optical Fibres and Their Applications, 1986, Warsaw, Poland
Abstract
Results of the selective etching treatments of the optical fibres are presented. Owing to the etching rate dependence on the dopant concentration, the microstructure of the optical fibres was visualised with the aid of scanning electron microscopy /SEM /. The qualitative distribution of the Ge and Si concentration across the fibre diameter is also investigated. Multi-mode and single-mode fibres were investigated by using different etching solutions based on HF. The doped or/and undoped areas were removed and concavities or convexities were etched on the fiber faces. Investigations permitted qualitative estimations of the dopant distributions in the fibre core and to obtain information about the quality of the fibres. The results are illustrated by SEM patterns.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Neffe and M. Szustakowski "Characterization Of The Microstructure Of Optical Fibres", Proc. SPIE 0670, Optical Fibres and Their Applications IV, (10 November 1986); https://doi.org/10.1117/12.938974
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Cited by 2 scholarly publications.
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KEYWORDS
Optical fibers

Etching

Chemical analysis

Thin film coatings

Germanium

Scanning electron microscopy

Silicon

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