Paper
25 November 1986 Two-Line-Coupling Beam-Quality Effects In Stimulated Raman Scattering
R. B. Holmes, A. Flusberg
Author Affiliations +
Proceedings Volume 0642, Modeling and Simulation of Optoelectronic Systems; (1986) https://doi.org/10.1117/12.975492
Event: 1986 Technical Symposium Southeast, 1986, Orlando, United States
Abstract
We present the results of calculations of the beam quality obtainable in a collimated, single-beam Raman beam cleanup system, in which the pump laser contains two lines whose frequency separation is enough to cause significant dispersive "slip" between them in the Raman amplifier. A specific example is the 351-353 nm line pair of an XeF laser. We start from equations coupling the various modes of the lines and their corresponding Stokes modes. Refractivity effects caused by nonuniform Raman--induced population transfer are specifically accounted for. The impact on beam quality is assessed as a function of the pressure in a H2 Raman amplifier, and it is shown that the minimum effect occurs at a pressure of 2.4 Atm, for which the motionally narrowed Raman linewidth takes its minimum value. The two-line coupling causes the population transfer due to the stronger of the two lines to adversely affect the beam quality of the weaker line. For an rms percent fluence modulation of 15 percent, the two-line coupling lowers the Strehl ratio (a measure of beam quality) by ~15 percent for a 1-μs XeF laser pulse length.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. B. Holmes and A. Flusberg "Two-Line-Coupling Beam-Quality Effects In Stimulated Raman Scattering", Proc. SPIE 0642, Modeling and Simulation of Optoelectronic Systems, (25 November 1986); https://doi.org/10.1117/12.975492
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Raman spectroscopy

Modulation

Raman scattering

Diffraction

Optoelectronics

Modeling and simulation

Laser scattering

Back to Top