Paper
1 February 1985 Laser Illuminated Nano-Second Microscope
A. M. Frank, D. F. Hein
Author Affiliations +
Proceedings Volume 0491, 16th Intl Congress on High Speed Photography and Photonics; (1985) https://doi.org/10.1117/12.967993
Event: 16th International Congress on High Speed Photography and Photonics, 1984, Strasbourg, France
Abstract
In high magnification systems laser speckle limits the resolution of laser illuminated targets. We have developed a broad bandwidth laser illuminator which substantially reduces the speckle. This laser has been incorporated with intensified camera technology and suitable lensing to provide a microscope system with good resolution over a 75-mm diameter image. The microscope currently has a 2-ns exposure onto film with magnification adjustable between 5 X and 50 X .*
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. M. Frank and D. F. Hein "Laser Illuminated Nano-Second Microscope", Proc. SPIE 0491, 16th Intl Congress on High Speed Photography and Photonics, (1 February 1985); https://doi.org/10.1117/12.967993
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Speckle

Cameras

Pulsed laser operation

YAG lasers

Imaging systems

Microscopes

Bridges

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