Automated Data Reduction For Speckle Metrology

Gene E. Maddux

doi:10.1117/12.933944

7 July 1983 Automated Data Reduction For Speckle Metrology

Gene E. Maddux

Proceedings Volume 0353, Industrial and Commercial Applications of Holography; (1983) https://doi.org/10.1117/12.933944
Event: 26th Annual Technical Symposium, 1982, San Diego, United States

Abstract

Speckle Metrology has transitioned from a laboratory curiosity to a useful engineering tool. It is now in a stage where some means is required to process the enormous amount of data it is capable of generating. This paper explores the requirements and characteristics for an automated data reduction system. Examples are given of current operational systems and what direction future system developments may take.

Citation Download Citation

Gene E. Maddux "Automated Data Reduction For Speckle Metrology", Proc. SPIE 0353, Industrial and Commercial Applications of Holography, (7 July 1983); https://doi.org/10.1117/12.933944

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