Scattering From Surface RoughnessÃ¢â‚¬â€?Implications On X-Ray Imaging

R J Noll; P Glenn

doi:10.1117/12.959618

3 March 1981 Scattering From Surface RoughnessÃ¢â‚¬â€?Implications On X-Ray Imaging

R J Noll, P Glenn

Proceedings Volume 0257, Radiation Scattering in Optical Systems; (1981) https://doi.org/10.1117/12.959618
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States

Abstract

Results of an analysis of surface profile measurements by J. Bennett on a set of very smooth flat surfaces is presented. Visible scattering profiles are predicted and compared with measured scatter profiles. The predicted scatter profiles are integrated for compari-son with total integrated scatter measurements (TIS). Using the model analysis at X-ray wavelengths illustrates the impact of various surface profiles on X-ray imaging.

Citation Download Citation

R J Noll and P Glenn "Scattering From Surface RoughnessÃ¢â‚¬â€?Implications On X-Ray Imaging", Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); https://doi.org/10.1117/12.959618

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available