Optical Pattern Recognition And Classification Invariant To Selectable Pattern Features

J. R. Leger; S. H. Lee

doi:10.1117/12.965620

4 December 1979 Optical Pattern Recognition And Classification Invariant To Selectable Pattern Features

J. R. Leger, S. H. Lee

Proceedings Volume 0201, Optical Pattern Recognition; (1979) https://doi.org/10.1117/12.965620
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

A coherent optical method of performing pattern recognition has been studied which is invariant to selectable pattern features. Two examples of pattern features frequently encountered in pattern recognition tasks are scale and rotation. A recognition scheme which is invariant to these features is able to detect an object independent of its size and angular orientation. In our case, the recognition scheme not only is invariant to these specific features, but can also be used to measure them.

Citation Download Citation

J. R. Leger and S. H. Lee "Optical Pattern Recognition And Classification Invariant To Selectable Pattern Features", Proc. SPIE 0201, Optical Pattern Recognition, (4 December 1979); https://doi.org/10.1117/12.965620

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