Paper
10 January 1977 Beam Deflection At High Accuracy And Precision
D. P. Jablonowski, J. Raamot
Author Affiliations +
Abstract
Techniques have been developed to extend the accuracy and repeatibility of X-Y beam deflection systems. Absolute beam placements of ± 5pm over 100mm (+ 1/20,000) with precisions of + 2.5μm (+ 1/40,000) have been demonstrated at speeds far beyond the limitation imposed by an optimum servo control. A comparison is made of scanning times at various precisions; results indicate that high accuracy and precision can be attained without materially sacrificing system speed. Basic to the operation of the deflection apparatus is an optical position monitoring capability and a unique control philosophy that drives the deflectors in open loop mode. Distortion is compensated by the position monitor and the control logic, so that beam placement has a guaranteed absolute accuracy in the deflection plane. Limitations of the present apparatus will be discussed, as well as possible extensions of precision and accuracy.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. P. Jablonowski and J. Raamot "Beam Deflection At High Accuracy And Precision", Proc. SPIE 0084, Laser Scanning Components and Techniques: Design Considerations/Trends, (10 January 1977); https://doi.org/10.1117/12.954921
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Cited by 1 scholarly publication.
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KEYWORDS
Distortion

Servomechanisms

Control systems

Laser scanners

Surface plasmons

Diffraction gratings

Diffraction

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