Study of beam diameter and test area effect on laser-induced damage threshold measurements in the nanosecond regime

Matthew S. Dabney; Brian Arnold; Cyrus Rashvand

doi:10.1117/12.2685272

24 November 2023 Study of beam diameter and test area effect on laser-induced damage threshold measurements in the nanosecond regime

Matthew S. Dabney, Brian Arnold, Cyrus Rashvand

Author Affiliations +

Proceedings Volume PC12726, Laser-Induced Damage in Optical Materials 2023; PC1272607 (2023) https://doi.org/10.1117/12.2685272
Event: SPIE Laser Damage, 2023, Dublin/Livermore, California, United States

Abstract

There has been a concern with the typical Laser-Induced Damage Threshold (LIDT) testing due to the small allowable spot size and the small required tested area. With the current tests, it is possible to actually miss defects entirely, resulting in a higher LIDT value. Experiments conducted in this study compare traditional LIDT measurements in the nanosecond regime made with a broad variant in spot sizes. These same spot sizes are also used to run larger area scans to evaluate the damage sites per area. Experimental results will be presented and discussed in the broader scope of developing a reliable LIDT standard.

Conference Presentation

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Matthew S. Dabney, Brian Arnold, and Cyrus Rashvand "Study of beam diameter and test area effect on laser-induced damage threshold measurements in the nanosecond regime", Proc. SPIE PC12726, Laser-Induced Damage in Optical Materials 2023, PC1272607 (24 November 2023); https://doi.org/10.1117/12.2685272

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KEYWORDS

Laser damage threshold

Beam diameter

Optical scanning systems

Laser development

Laser induced damage

Lasers

Mirrors

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