PROCEEDINGS VOLUME 9210
SPIE OPTICAL ENGINEERING + APPLICATIONS | 17-21 AUGUST 2014
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Editor Affiliations +
IN THIS VOLUME

5 Sessions, 12 Papers, 0 Presentations
Optics II  (3)
Applications  (2)
Proceedings Volume 9210 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
17-21 August 2014
San Diego, California, United States
Front Matter: Volume 9210
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921001 (2014) https://doi.org/10.1117/12.2084771
Diagnostics and Instrumentation I
Daniele La Civita, Natalia Gerasimova, Harald Sinn, Maurizio Vannoni
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921002 (2014) https://doi.org/10.1117/12.2061693
Marco Zangrando, Claudio Fava, Simone Gerusina, Riccardo Gobessi, Nicola Mahne, Eric Mazzucco, Lorenzo Raimondi, Luca Rumiz, Cristian Svetina
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921003 (2014) https://doi.org/10.1117/12.2062980
Optics II
Taito Osaka, Takashi Hirano, Makina Yabashi, Yasuhisa Sano, Kensuke Tono, Yuichi Inubushi, Takahiro Sato, Kanade Ogawa, Satoshi Matsuyama, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921009 (2014) https://doi.org/10.1117/12.2060238
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100B (2014) https://doi.org/10.1117/12.2061879
Tom Pardini, Sébastien Boutet, Joseph Bradley, Tilo Doeppner, Luke B. Fletcher, Dennis F. Gardner Jr., Randy M. Hill, Mark S. Hunter, Jacek Krzywinski, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100D (2014) https://doi.org/10.1117/12.2061087
Applications
F. Frassetto, P. Miotti, C. Callegari, M. de Simone, P. Finetti, E. Giangrisostomi, C. Grazioli, F. Iesari, A. Kivimäki, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100E (2014) https://doi.org/10.1117/12.2061765
Fabio Frassetto, Elke Ploenjes, Marion Kuhlmann, Luca Poletto
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100I (2014) https://doi.org/10.1117/12.2065257
Diagnostics and Instrumentation II
Timothy J. Maxwell, Christopher Behrens, Yuantao Ding, Zhirong Huang, Patrick Krejcik, Agostino Marinelli, Luciano Piccoli, Daniel Ratner
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100J (2014) https://doi.org/10.1117/12.2065252
P. Finetti, E. Allaria, B. Diviacco, C. Callegari, B. Mahieu, J. Viefhaus, M. Zangrando, G. De Ninno, G. Lambert, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100K (2014) https://doi.org/10.1117/12.2062717
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100L (2014) https://doi.org/10.1117/12.2062567
Sanghoon Song, Diling Zhu, Andrej Singer, Juhao Wu, Marcin Sikorski, Matthieu Chollet, Henrik Lemke, Roberto Alonso-Mori, James M. Glownia, et al.
Proceedings Volume X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100M (2014) https://doi.org/10.1117/12.2069362
Back to Top