PROCEEDINGS VOLUME 4098
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 30 JULY - 4 AUGUST 2000
Optical Devices and Diagnostics in Materials Science
Editor(s): David L. Andrews, Toshimitsu Asakura, Suganda Jutamulia, Wiley P. Kirk, Max G. Lagally, Ravindra B. Lal, James D. Trolinger, David L. Andrews
Editor Affiliations +
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
30 July - 4 August 2000
San Diego, CA, United States
Materials of Crystal Growth in Space
Marc L. Pusey, John Sumida
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401612
Matthias Dieckmann, Karsten Dierks
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401620
Chandra S. Vikram, William K. Witherow
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401628
Arunan Nadarajah, Huayu Li, John H. Konnert, Marc L. Pusey
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401635
Zhifu Liu, Sergey S. Sarkisov, Michael J. Curley, Alexander Leyderman, Yulong Cui, Javier Wu Li, Benjamin G. Penn
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401644
Instrumentation and Techniques for Nanoscale Materials and Applications
Alexei A. Malinin, Victor F. Ovchinnikov, Tero H. Toivola, Charlotta J.-J. Tuovinen
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401645
Katerina Moloni, Amit Lal, Max G. Lagally
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401613
Michael Schulz, Peter Thomsen-Schmidt, Ingolf Weingaertner
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401614
Peter Thomsen-Schmidt, Michael Schulz, Ingolf Weingaertner
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401615
Near-Field Optics
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401616
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401617
Tuan-Kay Lim
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401618
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401619
Xiumei Liu, Jia Wang
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401621
Christophe Gorecki, Sabry Khalfallah, Hideki Kawakatsu, Yasuhiko Arakawa
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401622
Yoshihiro Kawano, Chikara Abe, Teruo Kaneda, Yasushi Aono, Katsuyuki Abe, Keisuke Tamura, Susumu Terakawa
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401623
Biological Applications
Ole Faurskov Nielsen, Carina Koch Johansson, Kirsten L. Jakobsen, Daniel H. Christensen, Mette R. Wiegell, Thorvald Pedersen, Monika Gniadecka, Hans Christian Wulf, Peter Westh
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401624
Alvin Katz, Erik F. Kruger, Glenn Minko, C. H. Liu, Richard B. Rosen M.D., Robert R. Alfano
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401625
Raman Effect in Materials
Carole A. Cooper, Robert J. Young
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401626
Valerii M. Kobryanskii, Dmitri Yu. Paraschuk, Aleksandr N. Shchegolikhin, Albert N. Kuptsov, Nikolay N. Melnik
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401627
Zhe Chuan Feng, W. Wang, Wei Liu, Soo-Jin Chua, Geraint A. Evans, Martin Kuball, Ken P. J. Williams, G. D. Pitt
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401629
Yanling Ward, Robert J. Young, Robert A. Shatwell
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401630
Bing Kun Yu, Tianyan Yu, Guochang Jiang, Jianlin You
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401631
Art, Valuables, and Antiquities
Robert Withnall, Alan Derbyshire, Sigrun Thiel, Michael J. Hughes
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401632
Peter Vandenabeele, Luc Moens
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401633
Lore Kiefert, Henry A. Haenni, Jean-Pierre Chalain
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401634
Biological Applications
Chris A. Michaels, Claire E.J. Dentinger, Lee J. Richter, D. Bruce Chase, Richard R. Cavanagh, Stephan J. Stranick
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401636
Advances in Light Scattering
Marco Giuseppe Beghi, Carlo E. Bottani, Rosanna Pastorelli
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401637
Bruce J. Baer, Liang Zhao, Eric L. Chronister
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401638
YunSik Yu, SungChul Kim
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401639
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401640
Constantin Carabatos-Nedelec, Mohammed Ben Salah, Paul Becker
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401641
Peter Vandenabeele, Luc Moens, Howell G.M. Edwards
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401642
Instrumentation and Techniques for Nanoscale Materials and Applications
Thomas M. Heinzel, Silvia Luescher, Andreas Fuhrer, Gian Salis, Ryan Held, Klaus Ensslin, Werner Wegscheider, Max Bichler
Proceedings Volume Optical Devices and Diagnostics in Materials Science, (2000) https://doi.org/10.1117/12.401643
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