Phase correction for rapid en-face scanning with pulsed terahertz radiation

Stefan Katletz; Nico Vieweg; Benedikt Scherger; Bernd Heinen; Martin Koch; Karin Wiesauer

doi:10.1117/12.900994

11 August 2011 Phase correction for rapid en-face scanning with pulsed terahertz radiation

Stefan Katletz, Nico Vieweg, Benedikt Scherger, Bernd Heinen, Martin Koch, Karin Wiesauer

Proceedings Volume 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications; 81951L (2011) https://doi.org/10.1117/12.900994
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

An enhanced measurement system for terahertz pulsed imaging is presented that is capable of effectively performing en-face and three-dimensional scans of planar and curved surfaces. The bending of the scanning surface in one direction is compensated by synchronously advancing the mechanical delay time with the deflection of a scanning mirror. The second scanning mirror for the fast scanning direction forms a telecentric system and does not exhibit phase distortion.

Citation Download Citation

Stefan Katletz, Nico Vieweg, Benedikt Scherger, Bernd Heinen, Martin Koch, and Karin Wiesauer "Phase correction for rapid en-face scanning with pulsed terahertz radiation", Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 81951L (11 August 2011); https://doi.org/10.1117/12.900994

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