Edge detection based on wavelet analysis

Yan Ha; Xiaofei Wang

doi:10.1117/12.811780

28 January 2009 Edge detection based on wavelet analysis

Yan Ha, Xiaofei Wang

Proceedings Volume 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments; 71562Z (2009) https://doi.org/10.1117/12.811780
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

Edge detection is one of the most basic contents in image processing and identification and plays an important role in the image processing. A new edge detection method based on the multi-scale of wavelet analysis and improving the image segmentation of the best threshold is proposed. The characteristics of this new edge detection operator have been analyzed in this paper. The advantages and disadvantages between the new operator and those traditional edge detection operators have also been discussed.

Citation Download Citation

Yan Ha and Xiaofei Wang "Edge detection based on wavelet analysis", Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562Z (28 January 2009); https://doi.org/10.1117/12.811780

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