Paper
16 January 2006 Combining one- and two-dimensional signal recognition approaches to off-line signature verification
Siyuan Chen, Sargur Srihari
Author Affiliations +
Proceedings Volume 6067, Document Recognition and Retrieval XIII; 606701 (2006) https://doi.org/10.1117/12.642983
Event: Electronic Imaging 2006, 2006, San Jose, California, United States
Abstract
A signature verification method that combines recognition methods of one-dimensional signals, e.g., speech and on-line handwriting, and two-dimensional images, e.g., holistic word recognition in OCR and off-line handwriting is described. In the one-dimensional approach, a sequence of data is obtained by tracing the exterior contour of the signature which allows the application of string-matching algorithms. The upper and lower contours of the signature are first determined by ignoring small gaps between signature components. The contours are combined into a single sequence so as to define a pseudo-writing path. To match two signatures a non-linear normalization method, viz., dynamic time warping, is applied to segment them into curves. Shape descriptors based on Zernike moments are extracted as features from each segment. A harmonic distance is used for measuring signature similarity. The two-dimensional approach is based on using features describing the word-shape. When the two methods are combined, the overall performance is significantly better than either method alone. With a database of 1320 genuines and 1320 forgeries the combination method has an accuracy of 90%.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Siyuan Chen and Sargur Srihari "Combining one- and two-dimensional signal recognition approaches to off-line signature verification", Proc. SPIE 6067, Document Recognition and Retrieval XIII, 606701 (16 January 2006); https://doi.org/10.1117/12.642983
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Cited by 5 scholarly publications.
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KEYWORDS
Feature extraction

Binary data

Image segmentation

Stereolithography

Shape analysis

Detection and tracking algorithms

Performance modeling

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